Yen-Sheng Lu

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2008

1 EE Kun-Lin Hsieh, Yen-Sheng Lu: Model construction and parameter effect for TFT-LCD process based on yield analysis by using ANNs and stepwise regression. Expert Syst. Appl. 34(1): 717-724 (2008)

2008
1	EE	Kun-Lin Hsieh, Yen-Sheng Lu: Model construction and parameter effect for TFT-LCD process based on yield analysis by using ANNs and stepwise regression. Expert Syst. Appl. 34(1): 717-724 (2008)

Coauthor Index

1 Kun-Lin Hsieh [1]