Toh-Ming Lu

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2003

1 EE Kwang-Su Lee, Toh-Ming Lu, X.-C. Zhang: The measurement of the dielectric and optical properties of nano thin films by THz differential time-domain spectroscopy. Microelectronics Journal 34(1): 63-69 (2003)

2003
1	EE	Kwang-Su Lee, Toh-Ming Lu, X.-C. Zhang: The measurement of the dielectric and optical properties of nano thin films by THz differential time-domain spectroscopy. Microelectronics Journal 34(1): 63-69 (2003)

Coauthor Index

1 Kwang-Su Lee [1]

2 X.-C. Zhang [1]