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Hong-Dar Lin

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2008
6EEHong-Dar Lin: Tiny surface defect inspection of electronic passive components using discrete cosine transform decomposition and cumulative sum techniques. Image Vision Comput. 26(5): 603-621 (2008)
2007
5EEHong-Dar Lin, Chung-Yu Chung, Singa Wang Chiu: Computer-Aided Vision System for Surface Blemish Detection of LED Chips. ICANNGA (2) 2007: 525-533
4EEHong-Dar Lin, Chung-Yu Chung: A Wavelet-Based Neural Network Applied to Surface Defect Detection of LED Chips. ISNN (2) 2007: 785-792
3EEHong-Dar Lin: Automated visual inspection of ripple defects using wavelet characteristic based multivariate statistical approach. Image Vision Comput. 25(11): 1785-1801 (2007)
2006
2EEHong-Dar Lin, Chih-Hao Chien: Automated Detection of Color Non-Uniformity Defects in TFT-LCD. IJCNN 2006: 1405-1412
1EEHong-Dar Lin, Singa Wang Chiu: Computer-Aided Vision System for MURA-Type Defect Inspection in Liquid Crystal Displays. PSIVT 2006: 442-452

Coauthor Index

1Chih-Hao Chien [2]
2Singa Wang Chiu [1] [5]
3Chung-Yu Chung [4] [5]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)