| 2008 |
|---|
| 6 | EE | Hong-Dar Lin:
Tiny surface defect inspection of electronic passive components using discrete cosine transform decomposition and cumulative sum techniques.
Image Vision Comput. 26(5): 603-621 (2008) |
| 2007 |
|---|
| 5 | EE | Hong-Dar Lin,
Chung-Yu Chung,
Singa Wang Chiu:
Computer-Aided Vision System for Surface Blemish Detection of LED Chips.
ICANNGA (2) 2007: 525-533 |
| 4 | EE | Hong-Dar Lin,
Chung-Yu Chung:
A Wavelet-Based Neural Network Applied to Surface Defect Detection of LED Chips.
ISNN (2) 2007: 785-792 |
| 3 | EE | Hong-Dar Lin:
Automated visual inspection of ripple defects using wavelet characteristic based multivariate statistical approach.
Image Vision Comput. 25(11): 1785-1801 (2007) |
| 2006 |
|---|
| 2 | EE | Hong-Dar Lin,
Chih-Hao Chien:
Automated Detection of Color Non-Uniformity Defects in TFT-LCD.
IJCNN 2006: 1405-1412 |
| 1 | EE | Hong-Dar Lin,
Singa Wang Chiu:
Computer-Aided Vision System for MURA-Type Defect Inspection in Liquid Crystal Displays.
PSIVT 2006: 442-452 |
