Xuanhua Li
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2007
1
EE
Xuanhua Li,
Donald Yeung
: Application-Level Correctness and its Impact on Fault Tolerance.
HPCA 2007
: 181-192
Coauthor
Index
1
Donald Yeung
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
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