2005 | ||
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2 | EE | Wenjian Li, Hoang Pham: Reliability modeling of multi-state degraded systems with multi-competing failures and random shocks. IEEE Transactions on Reliability 54(2): 297-303 (2005) |
1 | EE | Wenjian Li, Hoang Pham: An inspection-maintenance model for systems with multiple competing processes. IEEE Transactions on Reliability 54(2): 318-327 (2005) |
1 | Hoang Pham | [1] [2] |