Tongwu Li
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2006
1
EE
Yu Ren
, Tongwu Li: A New Method for Testing Embedded Software with Scenario Pattern.
Edutainment 2006
: 178-182
Coauthor
Index
1
Yu Ren
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
