J. Chien-Mo Li
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2005
1
EE
J. Chien-Mo Li: Diagnosis of single stuck-at faults and multiple timing faults in scan chains.
IEEE Trans. VLSI Syst. 13
(6): 708-718 (2005)
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)