Chenhua Li
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2007
1
EE
Chenhua Li,
N. Fard
: Optimum Bivariate Step-Stress Accelerated Life Test for Censored Data.
IEEE Transactions on Reliability 56
(1): 77-84 (2007)
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Index
1
N. Fard
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
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