Gene W. Lee

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1985

1 Frances D. Koo, Gene W. Lee: Isolating Failures within VLSI Chips That Incorporate Signature Analysis and Set/Scan Techniques. ITC 1985: 372-379

1985
1		Frances D. Koo, Gene W. Lee: Isolating Failures within VLSI Chips That Incorporate Signature Analysis and Set/Scan Techniques. ITC 1985: 372-379

Coauthor Index

1 Frances D. Koo [1]