Tai-Xiang Lai

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2006

1 EE Tai-Xiang Lai, Ming-Dou Ker: Method to Evaluate Cable Discharge Event (CDE) Reliability of Integrated Circuits in CMOS Technology. ISQED 2006: 597-602

2006
1	EE	Tai-Xiang Lai, Ming-Dou Ker: Method to Evaluate Cable Discharge Event (CDE) Reliability of Integrated Circuits in CMOS Technology. ISQED 2006: 597-602

Coauthor Index

1 Ming-Dou Ker [1]