E. Kurt
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1998
1
EE
R. Kasap
, E. Kurt: Technical Note: An investigation of chaos in the RL-diode circuit using the BDS test.
JAMDS 2
(2): 193-199 (1998)
Coauthor
Index
1
R. Kasap
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
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