| 2008 |
|---|
| 6 | | Toni Kuparinen,
Ville Kyrki,
Pekka J. Toivanen:
Measurement Noise in Photometric Stereo Based Surface Reconstruction.
VISAPP (2) 2008: 571-576 |
| 2007 |
|---|
| 5 | EE | Toni Kuparinen,
Ville Kyrki,
Jarno Mielikäinen,
Pekka J. Toivanen:
On Surface Topography Reconstruction from Gradient Fields.
ICIP (2) 2007: 545-548 |
| 4 | EE | Toni Kuparinen,
Ville Kyrki,
Jarno Mielikäinen,
Pekka J. Toivanen:
Paper Surface Topography Using Three-light Photometric Stereo.
MVA 2007: 45-48 |
| 2006 |
|---|
| 3 | EE | Leena Ikonen,
Toni Kuparinen,
Eduardo Villanueva,
Pekka J. Toivanen:
Distance Transforms on Anisotropic Surfaces for Surface Roughness Measurement.
DGCI 2006: 651-662 |
| 2005 |
|---|
| 2 | EE | Toni Kuparinen,
Oleg Rodionov,
Pekka J. Toivanen,
Jarno Mielikäinen,
Vladimir Bochko,
Ate Korkalainen,
Juha Parviainen,
Erik Vartiainen:
Fractal Dimension Analysis and Statistical Processing of Paper Surface Images Towards Surface Roughness Measurement.
SCIA 2005: 1218-1227 |
| 2003 |
|---|
| 1 | EE | Toni Kuparinen,
Arto Kaarna,
Pekka J. Toivanen:
Enhanced Model for Chromaticity Differences.
SCIA 2003: 812-819 |
