Anand P. Kulkarni

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2006

2 EE Anand P. Kulkarni, Thomas J. Grebinski: mTest: An Industry-Wide Database of VLSI Layouts for Quality Control. ISQED 2006: 659-664

1 EE Anand P. Kulkarni, Thomas J. Grebinski: Partial Selective Encryption: An Improved System for Protecting VLSI Design Data in the OASIS format. ISQED 2006: 676-681

2006
2	EE	Anand P. Kulkarni, Thomas J. Grebinski: mTest: An Industry-Wide Database of VLSI Layouts for Quality Control. ISQED 2006: 659-664
1	EE	Anand P. Kulkarni, Thomas J. Grebinski: Partial Selective Encryption: An Improved System for Protecting VLSI Design Data in the OASIS format. ISQED 2006: 676-681

Coauthor Index

1 Thomas J. Grebinski [1] [2]