| 2007 |
| 12 | EE | Dharmalingam Ganesan,
Jens Knodel,
Ronny Kolb,
Uwe Haury,
Gerald Meier:
Comparing Costs and Benefits of Different Test Strategies for a Software Product Line: A Study from Testo AG.
SPLC 2007: 74-83 |
| 2006 |
| 11 | EE | Ronny Kolb,
Dharmalingam Ganesan,
Dirk Muthig,
Masanori Kagino,
Hideharu Teranishi:
Goal-Oriented Performance Analysis of Reusable Software Components.
ICSR 2006: 368-381 |
| 10 | EE | Christian Denger,
Ronny Kolb:
Testing and inspecting reusable product line components: first empirical results.
ISESE 2006: 184-193 |
| 9 | EE | Ronny Kolb,
Dirk Muthig:
Making testing product lines more efficient by improving the testability of product line architectures.
ROSATEA 2006: 22-27 |
| 8 | | Ronny Kolb,
Isabel John,
Jens Knodel,
Dirk Muthig,
Uwe Haury,
Gerald Meier:
Experiences with Product Line Development of Embedded Systems at Testo AG.
SPLC 2006: 172-181 |
| 7 | | Ronny Kolb,
Dirk Muthig:
Architecture-Centric Quality Engineering form Software Product Lines.
SPLC 2006: 226 |
| 6 | EE | Ronny Kolb,
Dirk Muthig,
Thomas Patzke,
Kazuyuki Yamauchi:
Refactoring a legacy component for reuse in a software product line: a case study.
Journal of Software Maintenance 18(2): 109-132 (2006) |
| 2005 |
| 5 | EE | Klaus Schmid,
Isabel John,
Ronny Kolb,
Gerald Meier:
Introducing the puLSE approach to an embedded system population at testo AG.
ICSE 2005: 544-552 |
| 4 | EE | Ronny Kolb,
Dirk Muthig,
Thomas Patzke,
Kazuyuki Yamauchi:
A Case Study in Refactoring a Legacy Component for Reuse in a Product Line.
ICSM 2005: 369-378 |
| 2004 |
| 3 | EE | Ronny Kolb,
Dirk Muthig:
Quality Assurance for Software Product Lines.
SPLC 2004: 312 |
| 2 | EE | Ronny Kolb,
John D. McGregor,
Dirk Muthig:
Workshop on Quality Assurance in Reuse Contexts.
SPLC 2004: 330 |
| 2003 |
| 1 | EE | Barbara Paech,
Antje von Knethen,
Jörg Dörr,
Joachim Bayer,
Daniel Kerkow,
Ronny Kolb,
Adam Trendowicz,
Teade Punter,
Allen H. Dutoit:
An Experience-Based Approach for Integrating Architecture and Requirements Engineering.
STRAW 2003: 142-149 |