| |
| 2006 | ||
|---|---|---|
| 2 | EE | Wei Gao, Atsushi Shibuya, Yasuo Yoshikawa, Satoshi Kiyono, C. H. Park: Separation of scanning error motions for surface profile measurement of aspheric micro lens. IJMR 1(3): 267-282 (2006) |
| 2004 | ||
| 1 | EE | Wei Gao, S. Genda, Y. Kudo, Satoshi Kiyono, J. Patten: A hybrid nano-probe for precision nanofabrication of complex surfaces. ICARCV 2004: 173-177 |
| 1 | Wei Gao | [1] [2] |
| 2 | S. Genda | [1] |
| 3 | Y. Kudo | [1] |
| 4 | C. H. Park | [2] |
| 5 | J. Patten | [1] |
| 6 | Atsushi Shibuya | [2] |
| 7 | Yasuo Yoshikawa | [2] |