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Y. I. Kim

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2000
1EED. H. Ryu, T. W. Choi, Y. I. Kim, S. H. Nahm: Measurement of the fatigue-crack using image processing techniques. KES 2000: 121-124

Coauthor Index

1T. W. Choi [1]
2S. H. Nahm [1]
3D. H. Ryu [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)