V. Kim
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1997
1
EE
V. Kim,
T. Chen
: Assessing SRAM test coverage for sub-micron CMOS technologies.
VTS 1997
: 24-30
Coauthor
Index
1
T. Chen
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
