Tae-Hyeon Kim
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1999
1
EE
Tae-Hyeon Kim,
Tai-Hoon Cho
,
Young Shik Moon
,
Sung-Han Park
: Visual inspection system for the classification of solder joints.
Pattern Recognition 32
(4): 565-575 (1999)
Coauthor
Index
1
Tai-Hoon Cho
[
1
]
2
Young Shik Moon
[
1
]
3
Sung-Han Park
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
