Sooyoun Kim
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2006
1
EE
Byungwhan Kim
, Sooyoun Kim,
Sang Jeen Hong
: Recognition of Plasma-Induced X-Ray Photoelectron Spectroscopy Fault Pattern Using Wavelet and Neural Network.
ISNN (2) 2006
: 1036-1042
Coauthor
Index
1
Sang Jeen Hong
[
1
]
2
Byungwhan Kim
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)