| 2004 |
|---|
| 3 | EE | K. Y. Kim,
B. S. Kim,
M. C. Kim,
S. Kim:
Dynamic inverse obstacle problems with electrical impedance tomography.
Mathematics and Computers in Simulation 66(4-5): 399-408 (2004) |
| 2003 |
|---|
| 2 | | In Soo Lee,
J. T. Kim,
J. W. Lee,
Y. J. Lee,
K. Y. Kim:
Neural Networks-based Fault Detection and Isolation of Nonlinear Systems.
Neural Networks and Computational Intelligence 2003: 142-147 |
| 1 | EE | I. S. Lee,
J. T. Kim,
J. W. Lee,
D. Y. Lee,
K. Y. Kim:
Model-based fault detection and isolation method using ART2 neural network.
Int. J. Intell. Syst. 18(10): 1087-1100 (2003) |
