Junghee Kim
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2005
1
EE
Youngshin Han
, Junghee Kim,
Chilgee Lee
: Automatic Detection of Failure Patterns Using Data Mining.
KES (2) 2005
: 1312-1316
Coauthor
Index
1
Youngshin Han
[
1
]
2
Chilgee Lee
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
