| |
| 2007 | ||
|---|---|---|
| 4 | EE | Bruce Kim: Test Technology Newsletter April 2007. J. Electronic Testing 23(2-3): 113-114 (2007) |
| 3 | EE | Bruce Kim: Test Technology Newsletter - October 2007. J. Electronic Testing 23(5): 371-372 (2007) |
| 2 | EE | Bruce Kim: Test Technology Newsletter - December 2007. J. Electronic Testing 23(6): 467-468 (2007) |
| 1997 | ||
| 1 | EE | Madhavan Swaminathan, Bruce Kim, Abhijit Chatterjee: A Survey of Test Techniques for MCM Substrates. J. Electronic Testing 10(1-2): 27-38 (1997) |
| 1 | Abhijit Chatterjee | [1] |
| 2 | Madhavan Swaminathan | [1] |