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| 2003 | ||
|---|---|---|
| 1 | EE | Pavel L. Komarov, Mihai G. Burzo, Gunhan Kaytaz, Peter E. Raad: Transient thermo-reflectance measurements of the thermal conductivity and interface resistance of metallized natural and isotopically-pure silicon. Microelectronics Journal 34(12): 1115-1118 (2003) |
| 1 | Mihai G. Burzo | [1] |
| 2 | Pavel L. Komarov | [1] |
| 3 | Peter E. Raad | [1] |