Scott L. Kaplin
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1988
1
EE
Scott L. Kaplin,
George D. Hadden
,
Lina Volovik
,
Rick Swanson
: A General Architecture for Factory-based Diagnosis of Electronics.
IEA/AIE (Vol. 1) 1988
: 100-108
Coauthor
Index
1
George D. Hadden
[
1
]
2
Rick Swanson
[
1
]
3
Lina Volovik
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
