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P. Kalpana

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2008
2EEP. Kalpana, K. Gunavathi: Wavelet based fault detection in analog VLSI circuits using neural networks. Appl. Soft Comput. 8(4): 1592-1598 (2008)
2005
1EEP. Kalpana, K. Gunavathi: A Novel Specification Based Test Pattern Generation Using Genetic Algorithm and Wavelets. VLSI Design 2005: 504-507

Coauthor Index

1K. Gunavathi [1] [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)