Gerald H. Johnson

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2000

2 Gerald H. Johnson: Challenges of high supply currents during VLSI test. ITC 2000: 1013-1020

1995

1 Gerald H. Johnson, Jan B. Wilstrup: A General Purpose ATE Based I_DDQ Measurement Circuit. ITC 1995: 97-105

2000
2		Gerald H. Johnson: Challenges of high supply currents during VLSI test. ITC 2000: 1013-1020
1995
1		Gerald H. Johnson, Jan B. Wilstrup: A General Purpose ATE Based I_DDQ Measurement Circuit. ITC 1995: 97-105

Coauthor Index

1 Jan B. Wilstrup [1]