Yue Jia
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2008
1
EE
Yue Jia,
Mark Harman
: Constructing Subtle Faults Using Higher Order Mutation Testing.
SCAM 2008
: 249-258
Coauthor
Index
1
Mark Harman
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
