| |
| 1998 | ||
|---|---|---|
| 1 | EE | Van-Duc Nguyen, J. Alison Noble, Joseph L. Mundy, John Janning, Joseph Ross: Exhaustive Detection of Manufacturing Flaws as Abnormalities. CVPR 1998: 945-952 |
| 1 | Joseph L. Mundy | [1] |
| 2 | Van-Duc Nguyen | [1] |
| 3 | J. Alison Noble | [1] |
| 4 | Joseph Ross | [1] |