1998 | ||
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1 | EE | Van-Duc Nguyen, J. Alison Noble, Joseph L. Mundy, John Janning, Joseph Ross: Exhaustive Detection of Manufacturing Flaws as Abnormalities. CVPR 1998: 945-952 |
1 | Joseph L. Mundy | [1] |
2 | Van-Duc Nguyen | [1] |
3 | J. Alison Noble | [1] |
4 | Joseph Ross | [1] |