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| 1998 | ||
|---|---|---|
| 1 | EE | Satoshi Tsuji, Katsuhiro Tsujimoto, Hideo Iwama: Application of cross-sectional transmission electron microscopy to thin-film-transistor failure analysis. IBM Journal of Research and Development 42(3): 509-516 (1998) |
| 1 | Satoshi Tsuji | [1] |
| 2 | Katsuhiro Tsujimoto | [1] |