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Takashi Ishimura

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2000
1EEKoji Nakamae, Takashi Ishimura, Hiromu Fujioka: EB tester fault localization algorithm for combinational circuits by utilizing fault simulation and test pattern sequence for EB tester. Systems and Computers in Japan 31(8): 41-48 (2000)

Coauthor Index

1Hiromu Fujioka [1]
2Koji Nakamae [1]

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