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2000 | ||
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1 | EE | Koji Nakamae, Takashi Ishimura, Hiromu Fujioka: EB tester fault localization algorithm for combinational circuits by utilizing fault simulation and test pattern sequence for EB tester. Systems and Computers in Japan 31(8): 41-48 (2000) |
1 | Hiromu Fujioka | [1] |
2 | Koji Nakamae | [1] |