Shohei Ikehara
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1992
1
Koichi Yamashita
, Shohei Ikehara: A Design and Yield Evaluation Technique for Wafer-Scale Memory.
IEEE Computer 25
(4): 19-27 (1992)
Coauthor
Index
1
Koichi Yamashita
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1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
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