| |
| 2003 | ||
|---|---|---|
| 2 | EE | Icko Eric Timothy Iben, Yu-Min Lee, Wenchien D. Hsiao: Steady-state thermal characteristics of AMR read/write heads used in tape storage drives. IBM Journal of Research and Development 47(4): 401-414 (2003) |
| 1 | EE | Icko Eric Timothy Iben: Head reliability of AMR sensors based on thermal stress tests. IBM Journal of Research and Development 47(4): 415-428 (2003) |
| 1 | Wenchien D. Hsiao | [2] |
| 2 | Yu-Min Lee | [2] |