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| 2000 | ||
|---|---|---|
| 2 | EE | Seung H. Hwang, Gwan S. Choi: A Reliability Testing Environment for Off-the-Shelf Memory Subsystems. IEEE Design & Test of Computers 17(3): 116-124 (2000) |
| 1998 | ||
| 1 | EE | Seung H. Hwang, Gwan S. Choi: On-Chip Cache Memory Resilience. HASE 1998: 240-247 |
| 1 | Gwan S. Choi (Gwan Choi) | [1] [2] |