2000 | ||
---|---|---|
2 | EE | Seung H. Hwang, Gwan S. Choi: A Reliability Testing Environment for Off-the-Shelf Memory Subsystems. IEEE Design & Test of Computers 17(3): 116-124 (2000) |
1998 | ||
1 | EE | Seung H. Hwang, Gwan S. Choi: On-Chip Cache Memory Resilience. HASE 1998: 240-247 |
1 | Gwan S. Choi (Gwan Choi) | [1] [2] |