Chih-Han Hu

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2008

1 EE Chen-Fu Chien, Chih-Han Hu, Chi-Yung Lin: Analysing inspection frequency for wafer bumping process and an empirical study of UNISON decision framework. IJMTM 14(1/2): 130-144 (2008)

2008
1	EE	Chen-Fu Chien, Chih-Han Hu, Chi-Yung Lin: Analysing inspection frequency for wafer bumping process and an empirical study of UNISON decision framework. IJMTM 14(1/2): 130-144 (2008)

Coauthor Index

1 Chen-Fu Chien [1]

2 Chi-Yung Lin [1]