S.-C. Horng

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2006

1 EE S.-Y. Lin, S.-C. Horng: Application of an Ordinal Optimization Algorithm to the Wafer Testing Process. IEEE Transactions on Systems, Man, and Cybernetics, Part A 36(6): 1229-1234 (2006)

2006
1	EE	S.-Y. Lin, S.-C. Horng: Application of an Ordinal Optimization Algorithm to the Wafer Testing Process. IEEE Transactions on Systems, Man, and Cybernetics, Part A 36(6): 1229-1234 (2006)

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