M. H. Ho
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1999
1
EE
E. C. Tan
, M. H. Ho: Matrix Method to Detect Logic Hazards in Combinational Circuits with EX-OR Gates.
J. UCS 5
(11): 765-776 (1999)
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Index
1
E. C. Tan
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
