Kazuyuki Hirose
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2007
1
EE
Tetsuo Endoh
, Kazuyuki Hirose,
Kenji Shiraishi
: Physical Origin of Stress-Induced Leakage Currents in Ultra-Thin Silicon Dioxide Films.
IEICE Transactions 90-C
(5): 955-961 (2007)
Coauthor
Index
1
Tetsuo Endoh
[
1
]
2
Kenji Shiraishi
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
