Bert Haskell
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1994
1
EE
Shekar Rao
, Bert Haskell,
Ian Yee
: Trade-off analysis on cost and manufacturing technology of an electronic product: Case study.
J. Electronic Testing 5
(2-3): 219-228 (1994)
Coauthor
Index
1
Shekar Rao
[
1
]
2
Ian Yee
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)