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Ilker Hamzaoglu

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2007
17EEMustafa Parlak, Ilker Hamzaoglu: A Low Power Implementation of H.264 Adaptive Deblocking Filter Algorithm. AHS 2007: 127-133
16EEEsra Sahin, Ilker Hamzaoglu: Interactive presentation: An efficient hardware architecture for H.264 intra prediction algorithm. DATE 2007: 183-188
15EESerkan Oktem, Ilker Hamzaoglu: An Efficient Hardware Architecture for Quarter-Pixel Accurate H.264 Motion Estimation. DSD 2007: 444-447
14EEEsra Sahin, Ilker Hamzaoglu: An Efficient Intra Prediction Hardware Architecture for H.264 Video Decoding. DSD 2007: 448-454
13EEIlker Hamzaoglu, Ozgur Tasdizen, Esra Sahin: An efficient H.264 intra frame coder system design. VLSI-SoC 2007: 200-205
2006
12EEMustafa Parlak, Ilker Hamzaoglu: An Efficient Hardware Architecture for H.264 Adaptive Deblocking Filter. AHS 2006: 381-385
11EESinan Yalcin, Ilker Hamzaoglu: A High Performance Hardware Architecture for Half-Pixel Accurate H.264 Motion Estimation. VLSI-SoC 2006: 63-67
2005
10 Sinan Yalcin, Hasan F. Ates, Ilker Hamzaoglu: A High Performance Hardware Architecture for an SAD Reuse based Hierarchical Motion Estimation Algorithm for H.264 Video Coding. FPL 2005: 509-514
2000
9 Ilker Hamzaoglu, Janak H. Patel: Deterministic Test Pattern Generation Techniques for Sequential Circuits. ICCAD 2000: 538-543
8EEIlker Hamzaoglu, Janak H. Patel: Reducing Test Application Time for Built-in-Self-Test Test Pattern Generators. VTS 2000: 369-376
7EEIlker Hamzaoglu, Janak H. Patel: Test set compaction algorithms for combinational circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 19(8): 957-963 (2000)
1999
6EEIlker Hamzaoglu, Janak H. Patel: Reducing Test Application Time for Full Scan Embedded Cores. FTCS 1999: 260-267
5EEIlker Hamzaoglu, Janak H. Patel: New Techniques for Deterministic Test Pattern Generation. J. Electronic Testing 15(1-2): 63-73 (1999)
1998
4EEIlker Hamzaoglu, Janak H. Patel: Test set compaction algorithms for combinational circuits. ICCAD 1998: 283-289
3EEIlker Hamzaoglu, Janak H. Patel: Compact two-pattern test set generation for combinational and full scan circuits. ITC 1998: 944-953
2EEIlker Hamzaoglu, Janak H. Patel: New Techniques for Deterministic Test Pattern Generation. VTS 1998: 446-452
1997
1 Hillol Kargupta, Ilker Hamzaoglu, Brian Stafford: Scalable, Distributed Data Mining - An Agent Architecture. KDD 1997: 211-214

Coauthor Index

1Hasan F. Ates [10]
2Hillol Kargupta [1]
3Serkan Oktem [15]
4Mustafa Parlak [12] [17]
5Janak H. Patel [2] [3] [4] [5] [6] [7] [8] [9]
6Esra Sahin [13] [14] [16]
7Brian Stafford [1]
8Ozgur Tasdizen [13]
9Sinan Yalcin [10] [11]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)