2003 |
8 | EE | Michiel Hagedoorn:
Nearest Neighbors Can Be Found Efficiently If the Dimension Is Small Relative to the Input Size.
ICDT 2003: 437-451 |
2000 |
7 | EE | Michiel Hagedoorn,
Mark H. Overmars,
Remco C. Veltkamp:
A New Visibility Partition for Affine Pattern Matching.
DGCI 2000: 358-370 |
6 | | Michiel Hagedoorn,
Mark H. Overmars,
Remco C. Veltkamp:
A Robust Affine Invariant Similarity Measure Based on Visibility.
EWCG 2000: 112-116 |
5 | EE | Remco C. Veltkamp,
Michiel Hagedoorn:
Shape Similarity Measures, Properties and Constructions.
VISUAL 2000: 467-476 |
1999 |
4 | EE | Michiel Hagedoorn,
Remco C. Veltkamp:
Measuring Resemblance of Complex Patterns.
DGCI 1999: 286-297 |
3 | | Michiel Hagedoorn,
Remco C. Veltkamp:
A Robust Affine Invariant Metric on Boundary Patterns.
IJPRAI 13(8): 1151-1164 (1999) |
2 | EE | Michiel Hagedoorn,
Remco C. Veltkamp:
Reliable and Efficient Pattern Matching Using an Affine Invariant Metric.
International Journal of Computer Vision 31(2-3): 203-225 (1999) |
1997 |
1 | EE | Michiel Hagedoorn,
Remco C. Veltkamp:
A General Method for Partial Point Set Matching.
Symposium on Computational Geometry 1997: 406-408 |