| |
| 2008 | ||
|---|---|---|
| 1 | EE | Adrian Kuhn, Bart Van Rompaey, Lea Haensenberger, Oscar Nierstrasz, Serge Demeyer, Markus Gälli, Koenraad Van Leemput: JExample: Exploiting Dependencies between Tests to Improve Defect Localization. XP 2008: 73-82 |
| 1 | Serge Demeyer | [1] |
| 2 | Markus Gälli | [1] |
| 3 | Adrian Kuhn | [1] |
| 4 | Koenraad Van Leemput (Koen Van Leemput) | [1] |
| 5 | Oscar Nierstrasz | [1] |
| 6 | Bart Van Rompaey | [1] |