Irit Grunin
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2008
1
EE
Yefim Haim Michlin
,
Lyubov Meshkov
, Irit Grunin: Improvement on "Sequential Testing" in MIL-HDBK-781A and IEC 61124.
IEEE Transactions on Reliability 57
(2): 379-387 (2008)
Coauthor
Index
1
Lyubov Meshkov
[
1
]
2
Yefim Haim Michlin
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
