A. D. J. van se Goor

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1994

1 EE A. D. J. van se Goor, Yervant Zorian: Effective march algorithms for testing single-order addressed memories. J. Electronic Testing 5(4): 337-345 (1994)

1994
1	EE	A. D. J. van se Goor, Yervant Zorian: Effective march algorithms for testing single-order addressed memories. J. Electronic Testing 5(4): 337-345 (1994)

Coauthor Index

1 Yervant Zorian [1]