2006 | ||
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2 | EE | Federica Cappelluti, F. Bonani, M. Furno, Giovanni Ghione, R. Carta, L. Bellemo, C. Bocchiola, L. Merlin: Physics-based mixed-mode reverse recovery modeling and optimization of Si PiN and MPS fast recovery diodes. Microelectronics Journal 37(3): 190-196 (2006) |
1993 | ||
1 | EE | Giovanni Ghione, Fabio Filicori: A computationally efficient unified approach to the numerical analysis of the sensitivity and noise of semiconductor devices. IEEE Trans. on CAD of Integrated Circuits and Systems 12(3): 425-438 (1993) |
1 | L. Bellemo | [2] |
2 | C. Bocchiola | [2] |
3 | F. Bonani | [2] |
4 | Federica Cappelluti | [2] |
5 | R. Carta | [2] |
6 | Fabio Filicori | [1] |
7 | M. Furno | [2] |
8 | L. Merlin | [2] |