Sébastien Gebus
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2007
1
Sébastien Gebus,
Kauko Leiviskä
: Defect-related knowledge acquisition for decision support systems in electronics assembly.
ICINCO-ICSO 2007
: 270-275
Coauthor
Index
1
Kauko Leiviskä
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1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
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