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L. Garcia-Deiros

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2007
1EESalvador Manich, L. Garcia-Deiros, Joan Figueras: Minimizing Test Time in Arithmetic Test-Pattern Generators With Constrained Memory Resources. IEEE Trans. on CAD of Integrated Circuits and Systems 26(11): 2046-2058 (2007)

Coauthor Index

1Joan Figueras [1]
2Salvador Manich [1]

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