2007 | ||
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1 | EE | Salvador Manich, L. Garcia-Deiros, Joan Figueras: Minimizing Test Time in Arithmetic Test-Pattern Generators With Constrained Memory Resources. IEEE Trans. on CAD of Integrated Circuits and Systems 26(11): 2046-2058 (2007) |
1 | Joan Figueras | [1] |
2 | Salvador Manich | [1] |