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T. A. García

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1999
2EET. A. García, Antonio J. Acosta, J. M. Mora, J. Ramos, José Luis Huertas: Self-Timed Boundary-Scan Cells for Multi-Chip Module Test. J. Electronic Testing 15(1-2): 115-127 (1999)
1998
1EET. A. García, Antonio J. Acosta, José L. Huertas, J. M. Mora, J. Ramos: Self-Timed Boundary-Scan Cells for Multi-Chip Module Test. VTS 1998: 92-97

Coauthor Index

1Antonio J. Acosta [1] [2]
2José Luis Huertas (José L. Huertas) [1] [2]
3J. M. Mora [1] [2]
4J. Ramos [1] [2]

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