Paul A. Ganfield
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1998
1
EE
Leland L. Day
, Paul A. Ganfield,
Dennis M. Rickert
,
Fred J. Ziegler
: Test methodology for a microprocessor with partial scan.
ITC 1998
: 708-716
Coauthor
Index
1
Leland L. Day
[
1
]
2
Dennis M. Rickert
[
1
]
3
Fred J. Ziegler
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
