M. Gall

List of publications from the DBLP Bibliography Server - FAQ

1997

1 EE C. S. Murthy, M. Gall: Process variation effects on circuit performance: TCAD simulation of 256-Mbit technology [DRAMs]. IEEE Trans. on CAD of Integrated Circuits and Systems 16(11): 1383-1389 (1997)

1997
1	EE	C. S. Murthy, M. Gall: Process variation effects on circuit performance: TCAD simulation of 256-Mbit technology [DRAMs]. IEEE Trans. on CAD of Integrated Circuits and Systems 16(11): 1383-1389 (1997)

Coauthor Index