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| 2004 | ||
|---|---|---|
| 1 | EE | Yongqi Fu, Zhongwei Shen, Ngoi Kok Ann Bryan: A novel harmless trimming for micro-device with defects and particles in arbitrary geometry by fine milling of focused ion beam. Microelectronics Journal 35(2): 111-115 (2004) |
| 1 | Ngoi Kok Ann Bryan | [1] |
| 2 | Zhongwei Shen | [1] |